A Kinetic Model of Dielectric Ageing

A kinetic model of dielectric ageing is presented. The central finding of this investigation is that there is a power-law relationship between the local electric field concentration and the rate of defect-tip initiated conducting crack growth. By applying such a power-law conducting crack growth rate expression to the evaluation of the life of solid dielectrics, the empirical classical ageing law of insulation materials can be derived theoretically as a lobical result. All the results are universal and agree with the experimental data of oxide films.